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Introduction

Basic Info.

Birth: 1964, Kagawa Prefecture
Affiliation: Graduate School of Natural Sci. and Tech., Okayama Univ.
      (Faculty) Dept. Electrical and Communication Eng., Faculty of Eng.
Motto： Always be happy and with gentle mind.
         
Contact: yoshifumi.yamashita[at mark]okayama-u.ac.jp

　　　　　


Recent state of mind

Youth should be regarded with respect.

Sound mind in sound body. The good health is the most important.

Is there any other measuring of value than money?

Research

Recent publication

  • Yoshifumi Yamashita, Ryu Nakata, Takeshi Nishikawa, Masaki Hada, and Yasuhiko Hayashi, "Expansion of Shockley stacking fault observed by scanning electron microscope and partial dislocation motion in 4H-SiC", J. Appl. Phys., 123, (2018).
  • Shinya Maki, Yoshifumi Yamashita, Tatsuya Fushimi, Yutaka Ohno, Ichiro Yonenaga, Takeshi Nishikawa, and Yasuhiko Hayashi, "Sb-doping effect on the dislocation motion in various Si1-xGex films", Proc. The Forum on the Sciecne and Technology of Silicon Materials 2014, p.75-80.
  • Masakazu Yabuki, Yoshifumi Yamashita, Tatsuro Tokura, Takeshi Nishikawa, and Yasuhiko Hayashi, "Electric-field effects on the stability of impurity levels on a grain boundary in mc-Si for solar cells", Proc. The Forum on the Sciecne and Technology of Silicon Materials 2014, p.209-213.
  • Yoshifumi Yamashita, Kan Tanemoto, Akihiro Tanaka, and Tatsuya Fushimi, "Effects of Sb-doping on Strain Relaxation of SiGe Film on Si Substrate", AIP Conference Proceedings,1583, 119 (2014).

Previous papers or others

See Directory of Researchers in Okayama Univ.


Education

Faculty

  • Complex Analysis
  • Experiments in Electrical and Communication Engineering, A

Graduate school

  • Electronic Materials (for Master Course)
  • Materials Properties (for Doctor Course)


Photo

Using this scanning electron microscope (joint use device in the University), we observe crystal defects such as dislocations or grain boundaries and evaluate their characteristics.



This machine is for measurement of depth profile of electric resistivity.
Control PC is an antique machine of IBM, which is now replaced.


Miscellaneous

Only in Japanese.

Update log

2018-1-9
Several parts were renewed
2015-5-21
Home page was renewed

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