Gudrun Kissinger IHP, Germany
"On the impact of
deposited oxide and nitride layers on oxide
precipitation
in Czochralski silicon"
Eddy
Simoen IMEC, Belgium
"Metal contamination
in semiconductor devices: a neveer ending
story?"
Michael
Sluydts
Ghent Univ., Belgium
"The road to
accuracy: a comparison of state-of-the-art ab
initio methods"
Simona
Binetti Univ.
Milano-Bicocca, Italy
"Photoluminescence
and infrared spectroscopy
for impurities
identification in silicon for photovoltaic
applications"
Gerhard
Wachutka Tech. Univ. Munich,
Germany
"Virtual Prototyping
of High Power Devices and Modules"
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