Gudrun Kissinger IHP, Germany
"On
the impact of deposited oxide and nitride
layers
on oxide
precipitation in Czochralski silicon"
Eddy
Simoen IMEC, Belgium
"Metal
contamination in semiconductor devices:
a neveer ending story?"
Michael Sluydts
Ghent Univ., Belgium
"The road to accuracy: a
comparison of state-of-the-art
ab
initio methods"
Simona Binetti Univ.
Milano-Bicocca, Italy
"Photoluminescence
and infrared spectroscopy for impurities
identification
in silicon for photovoltaic applications"
Gerhard
Wachutka Tech. Univ. Munich,
Germany
"Virtual
Prototyping of High Power Devices and Modules"
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